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Applied Scanning Probe Methods IX Characterization 1st Edition

Guided-Wave Optoelectronics Device Characterization, Analysis, and Design,0306451077,9780306451072
50 %

Guided-Wave Optoelec ...

Theodor Tamir, ...

定価: ¥ 37795

当ショップ価格: ¥ 18766

Nondestructive Materials Characterization With Applications to Aerospace Materials,3540405178,9783540405177
1 %

Nondestructive Mater ...

Norbert G. H. M ...

定価: ¥ 29502

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Scanning Electron Microscopy of Cerebellar Cortex,0306477114,9780306477119
46 %

Scanning Electron Mi ...

Orlando Castejó ...

定価: ¥ 16469

当ショップ価格: ¥ 8925

Optical Characterization of Solids,3540418032,9783540418030
14 %

Optical Characteriza ...

Daniela Dragoma ...

定価: ¥ 29502

当ショップ価格: ¥ 25439

Scanning Tunneling Microscopy III Theory of Stm and Related Scanning Probe Methods 2nd Edition,3540608249,9783540608240
72 %

Scanning Tunneling M ...

R. Wiesendanger ...

定価: ¥ 16469

当ショップ価格: ¥ 4599

Applications of Analytical Techniques to the Characterization of Materials,0306441896,9780306441899
37 %

Applications of Anal ...

Sandro Merino, ...

定価: ¥ 23578

当ショップ価格: ¥ 14748

Nondestructive Characterization of Materials IV,0306440474,9780306440472
14 %

Nondestructive Chara ...

J. F. Bussic(re ...

定価: ¥ 40165

当ショップ価格: ¥ 34675

Particles in Gases and Liquids 3 Detection, Characterization, and Control,0306444852,9780306444852
55 %

Particles in Gases a ...

K.L. Mittal

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当ショップ価格: ¥ 13199

Identifying Relevant Information for Testing Technique Selection An Instantiated Characterization Schema,1402074352,9781402074356
22 %

Identifying Relevant ...

Sira Vegas, Nat ...

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Topics in Fluorescence Spectroscopy Volume 4: Probe Design and Chemical Sensing,0306447843,9780306447846
23 %

Topics in Fluorescen ...

Joseph R. Lakow ...

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当ショップ価格: ¥ 33882

Air Pollution Modeling and its Application IX Proceedings of the 19th NATO/CCMS International Technical Meeting on Air Pollution Modeling and Its Application Held in Crete, Greece, September 29-October 4, 1991,0306442485,9780306442483
36 %

Air Pollution Modeli ...

H. Van Dop, H. ...

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Partial Differential Equations IX Elliptic Boundary Value Problems,3540570446,9783540570448
20 %

Partial Differential ...

M.S. Agranovich ...

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Handbook of Nanophase and Nanostructured Materials 4 Vols. 1st Edition,030647249X,9780306472497
80 %

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Z.L. Wang, Yi L ...

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Polyimides Synthesis, Characterization, and Applications Volume 2,0306416735,9780306416736
7 %

Polyimides Synthesis ...

K. L. Mittal

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Applied Scanning Probe Methods VII Biomimetics and Industrial Applications,3540373209,9783540373209
76 %

Applied Scanning Pro ...

Bharat Bhushan, ...

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Applied Scanning Probe Methods III Characterization,3540269096,9783540269090
62 %

Applied Scanning Pro ...

Bharat Bhushan, ...

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Applied Scanning Probe Methods X Biomimetics and Industrial Applications 1st Edition,3540740848,9783540740841
77 %

Applied Scanning Pro ...

Bharat Bhushan, ...

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当ショップ価格: ¥ 7257

Scanning Tunneling Microscopy I General Principles and Applications to Clean and Absorbate-Covered Surfaces 2nd Edition,3540584153,9783540584155
20 %

Scanning Tunneling M ...

Hans-Joachim Gü ...

定価: ¥ 11730

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Nanoscale Characterisation of Ferroelectric Materials Scanning Probe Microscopy Approach 1st Edition,3540206620,9783540206620
11 %

Nanoscale Characteri ...

M. Alexe, Marin ...

定価: ¥ 28317

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Characterization Techniques of Glasses and Ceramics,3540636579,9783540636571
10 %

Characterization Tec ...

Jesús Ma. Rinco ...

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Impact of Electron and Scanning Probe Microscopy on Materials Research,0792359399,9780792359395
56 %

Impact of Electron a ...

David G. Ricker ...

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Formal Description Techniques IX Theory, application and tools,041279490X,9780412794902

Formal Description T ...

R. Gotzhein, J. ...

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Algebra IX Finite Groups of Lie Type Finite-Dimensional Division Algebras,3540570381,9783540570387
61 %

Algebra IX Finite Gr ...

P.M. Cohn, A.I. ...

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Scanning Probe Microscopy in Nanoscience and Nanotechnology,3642035345,9783642035340
2 %

Scanning Probe Micro ...

Bharat Bhushan

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Atomic Force Microscopy/Scanning Tunneling Microscopy 3,0306462974,9780306462979
45 %

Atomic Force Microsc ...

Samuel H. Cohen ...

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Characterization of Distributions by the Method of Intensively Monotone Operators,3540138579,9783540138570
28 %

Characterization of ...

A. V. Kakosyan, ...

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Particles in Gases and Liquids 2 Detection, Characterization, and Control,0306438097,9780306438097
44 %

Particles in Gases a ...

K.L. Mittal

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当ショップ価格: ¥ 16498